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Proceedings Paper

Complex refractive indices of silicon crystals with various carrier concentrations in the millimeter and submillimeter wave regions
Author(s): Masanori Hangyo
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Paper Abstract

We have constracted a Mach-Zehnder type interferometric spectrometer in the millimeter wave region (75 - 170 GHz) to measure optical constants of solids. Using this spectrometer, we have measured complex refractive indices of silicon crystals with various resistivities (1 - 300 Ω -cm). The density and relaxation time of carriers are determined by the experimental dispersion of the refractive indices using the Drude model. The refractive indices in this region are compared with those measured by the far infrared Fourier spectrometer.

Paper Details

Date Published: 1 December 1990
PDF: 3 pages
Proc. SPIE 1514, 15th International Conference on Infrared and Millimeter Waves, 15141Y (1 December 1990); doi: 10.1117/12.2301480
Show Author Affiliations
Masanori Hangyo, Osaka Univ. (Japan)


Published in SPIE Proceedings Vol. 1514:
15th International Conference on Infrared and Millimeter Waves
Richard J. Temkin, Editor(s)

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