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Proceedings Paper

Effects of radiation on CCD devices
Author(s): Alvin S. Kanofsky
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Paper Abstract

We have studied the effects of radiation on the performance characteristics of CCD devices. The CCDs were exposed to radiation of the continuous electron beam of the Lehigh University Van de Graaff Radiation Facility.

Paper Details

Date Published: 15 January 1996
PDF: 7 pages
Proc. SPIE 2611, Optical Network Engineering and Integrity, (15 January 1996); doi: 10.1117/12.230116
Show Author Affiliations
Alvin S. Kanofsky, Lehigh Univ. (United States)


Published in SPIE Proceedings Vol. 2611:
Optical Network Engineering and Integrity
Hakan H. Yuce; Dilip K. Paul; Roger A. Greenwell, Editor(s)

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