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Proceedings Paper

Millimeter-wave imaging solutions for non-destructive testing (Conference Presentation)
Author(s): Fabian Friederich
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Paper Abstract

We report on our recent industrial development projects on millimeter-wave and terahertz imaging solutions for non-destructive testing. This involves system realizations as well as their integration in industrial environments.

Paper Details

Date Published: 14 March 2018
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Proc. SPIE 10531, Terahertz, RF, Millimeter, and Submillimeter-Wave Technology and Applications XI, 105310R (14 March 2018); doi: 10.1117/12.2300758
Show Author Affiliations
Fabian Friederich, Fraunhofer ITWM (Germany)


Published in SPIE Proceedings Vol. 10531:
Terahertz, RF, Millimeter, and Submillimeter-Wave Technology and Applications XI
Laurence P. Sadwick; Tianxin Yang, Editor(s)

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