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Proceedings Paper

The modeling of spatial and directional noise in FLIR 90, part 1: a 3D noise analysis methodology
Author(s): John A. D'Agostino
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Paper Abstract

Modern imaging sensors incorporate complex focal plane architectures and sophisticated post-detector processing. These advanced technical characteristics create the potential for multi-component noise generation which can exhibit effects temporally as well as along the vertical and horizontal image directions. Such complex three-dimensional (time, vertical, horizontal) noise cannot be adequately treated by previous mathematical analyses developed for simpler system designs where detector noise was predominant. In a parallel sense, earlier methods for noise measurement are no longer satisfactory. A new methodology has been developed at C2NVE0 to characterize the noise patterns exhibited by advanced thermal imaging systems. This effort has the ultimate objective of improved system noise modeling in the Center's FLIR90 thermal performance model. In the new methodology the total noise present in the output of the sensor is divided into an set of eight independent components. Each of these components is characterized by the presence or absence of specific characteristics in each direction in a three-dimensional coordinate system. The method represents a significant expansion of the standard techniques to characterize thermal system noise. This paper, the first in a series of three, explains the principles behind the 3-D noise methodology and the methods used. A second paper published simultaneously will describe how this methodology is implemented in a laboratory measurement environment. A third publication planned for a future date will discuss and apply the modeling techniques being developed to incorporate this noise methodology in FLIR90.

Paper Details

Date Published: 29 January 1992
PDF: 21 pages
Proc. SPIE 2075, Passive Sensors, 20750H (29 January 1992); doi: 10.1117/12.2300245
Show Author Affiliations
John A. D'Agostino, Night Vision and Electro-Optics Division (United States)

Published in SPIE Proceedings Vol. 2075:
Passive Sensors
Joseph S. Accetta; M. J. Cantella, Editor(s)

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