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Proceedings Paper

Inverse scattering for rough surfaces
Author(s): C. J. R. Sheppard
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Paper Abstract

Reconstruction of surface profiles from scattering data is considered in the Kirchhoff aproximation. For reconstruction of the profile phase information is required. For surfaces with Gaussian height variation, the autocorrelation function can be determined from intensity data.

Paper Details

Date Published: 1 September 1996
PDF: 2 pages
Proc. SPIE 2778, 17th Congress of the International Commission for Optics: Optics for Science and New Technology, 27783X (1 September 1996); doi: 10.1117/12.2299023
Show Author Affiliations
C. J. R. Sheppard, Univ. of Sydney (Australia)


Published in SPIE Proceedings Vol. 2778:
17th Congress of the International Commission for Optics: Optics for Science and New Technology
Joon-Sung Chang; Jai-Hyung Lee; ChangHee Nam, Editor(s)

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