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Proceedings Paper

Fabrication of infrared interferometer and its application for characterization of Ge
Author(s): Moriaki Wakaki
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Paper Abstract

A Fizeau type infrared(IR) interferometer was fabricated and its performance was characterized using a Ge and other infrared materials. A IR He-Ne laser(wavelength of 3.39micron) was used as a coherent light source and an infrared imaging camera system was used for data acquision and processing. An annealing effect of single crystal, polycrystal and cast grown Ge was investigated using the interferometer. IR transmission images of Ge were also observed using a black-body source and IR camera.

Paper Details

Date Published: 1 September 1996
PDF: 2 pages
Proc. SPIE 2778, 17th Congress of the International Commission for Optics: Optics for Science and New Technology, 27783T (1 September 1996); doi: 10.1117/12.2299019
Show Author Affiliations
Moriaki Wakaki, Tokai Univ. (Japan)


Published in SPIE Proceedings Vol. 2778:
17th Congress of the International Commission for Optics: Optics for Science and New Technology
Joon-Sung Chang; Jai-Hyung Lee; ChangHee Nam, Editor(s)

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