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Proceedings Paper

Examination of photodoping phenomenon by in-situ ellipsometric observation
Author(s): J. Lee
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Paper Abstract

Phenomenon due to Ag photodoping into amorphous As2S3 was examined with an ellipsometric method. Obtained values of ellipsometric parameters Ψ and ∆ were fitted by using multilayer model. It was found that each thickness of Ag, Ag:As2S3 and As2S3 layers showed a time dependent change during the diffusion process in photodoping and the optical constants of As2S3 change remarkably by Ag photodoping. These behaviors were explained in relation with photodoping mechanism.

Paper Details

Date Published: 1 September 1996
PDF: 2 pages
Proc. SPIE 2778, 17th Congress of the International Commission for Optics: Optics for Science and New Technology, 27783R (1 September 1996); doi: 10.1117/12.2299017
Show Author Affiliations
J. Lee, Kunsan National Univ. (Korea, Republic of)


Published in SPIE Proceedings Vol. 2778:
17th Congress of the International Commission for Optics: Optics for Science and New Technology
Joon-Sung Chang; Jai-Hyung Lee; ChangHee Nam, Editor(s)

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