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Proceedings Paper

Imaging with reflection near-field optical microscope in light of evanescent dipole radiation
Author(s): Mufei Xiao
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Paper Abstract

A theory to decompose the propagating waves and the evanescent field in the optical dipole radiation is applied to analyze the reflection near-field optical microscopy. It is theoretically and numerically demonstrated that a local field vertically polarized toward the sample surface at the very end of the probe will provide a longer evanescent field tail into the gap between the probe and the sample and, hence, will improve the imaging quality of the microscope.

Paper Details

Date Published: 1 September 1996
PDF: 2 pages
Proc. SPIE 2778, 17th Congress of the International Commission for Optics: Optics for Science and New Technology, 27781Y (1 September 1996); doi: 10.1117/12.2298952
Show Author Affiliations
Mufei Xiao, Univ. Nacional Autónoma de México (Mexico)


Published in SPIE Proceedings Vol. 2778:
17th Congress of the International Commission for Optics: Optics for Science and New Technology
Joon-Sung Chang; Jai-Hyung Lee; ChangHee Nam, Editor(s)

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