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Proceedings Paper

Characterization of aliased fresnel hologram by pixel phase error function
Author(s): Raimo Silvennoinen
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Paper Abstract

We present what is to our knowledge the first experimental observation of the controlled intensity fluctuations of aliased Fresnel holograms of an 8pmx8pm pixel size by using an analytical function for calculating optical phase errors from the pixel area of an aperture of synthetic Fresnel holograms.

Paper Details

Date Published: 1 September 1996
PDF: 2 pages
Proc. SPIE 2778, 17th Congress of the International Commission for Optics: Optics for Science and New Technology, 27780Z (1 September 1996); doi: 10.1117/12.2298917
Show Author Affiliations
Raimo Silvennoinen, Univ. of Joensuu (Finland)


Published in SPIE Proceedings Vol. 2778:
17th Congress of the International Commission for Optics: Optics for Science and New Technology
Joon-Sung Chang; Jai-Hyung Lee; ChangHee Nam, Editor(s)

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