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Proceedings Paper

Critical light reflection from curved liquid surface and apptication for measuring contact angle
Author(s): Run Cai Miao
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Paper Abstract

Critical tight reflection, interforence and diffraction from raised and depressed curved liquid surface were discovered and its extraordinary intensity distribution photographed. Their formation and characters were discussed as wet 1, Furthermore, The applications formeasuring contact angle were discribed and experimental results were reported.

Paper Details

Date Published: 1 September 1996
PDF: 2 pages
Proc. SPIE 2778, 17th Congress of the International Commission for Optics: Optics for Science and New Technology, 27780T (1 September 1996); doi: 10.1117/12.2298911
Show Author Affiliations
Run Cai Miao, Shaanxi Normal Univ. (China)


Published in SPIE Proceedings Vol. 2778:
17th Congress of the International Commission for Optics: Optics for Science and New Technology
Joon-Sung Chang; Jai-Hyung Lee; ChangHee Nam, Editor(s)

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