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Proceedings Paper

Analysis of x-ray interferometers for phase distribution measurement
Author(s): T. Nakano
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Paper Abstract

The X-ray interferometers are analyzed as a tool to measure a phase distribution of X-ray beams transmitted through phase objects. We calculate beam width using a dynamical diffraction theory of a spherical wave. The width defines the image resolution. From these results, it is found that the X ray quadruple-Lane-case (LLLL) interferometer has high image resolution compared with the X-ray triple-Lane-case (LLL) interferometer.

Paper Details

Date Published: 1 September 1996
PDF: 2 pages
Proc. SPIE 2778, 17th Congress of the International Commission for Optics: Optics for Science and New Technology, 277808 (1 September 1996); doi: 10.1117/12.2298890
Show Author Affiliations
T. Nakano, Osaka Prefecture Univ. (Japan)


Published in SPIE Proceedings Vol. 2778:
17th Congress of the International Commission for Optics: Optics for Science and New Technology
Joon-Sung Chang; Jai-Hyung Lee; ChangHee Nam, Editor(s)

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