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Far infrared ellipsometric study of HTSC gap in ab- and c-oriented epitaxial YBaCuO films
Author(s): A. B. Sushkov
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Paper Abstract

To test different models of HTSC and to study mechanism of this phenomenon comparison of themeasured complex dielectric function e(w, T) and of the computed one is very useful. In the case ofanisotropic substance, such as Y Ba2Cu307, e(w, T) is tenzor with different ca, cb, ec components. However,the structure of oriented YBaCuO films permits to determine ec and only averaged cab value. To carryout ellipsometric measurements on small samples in far IR the light beam should be focused onto thesample surface. Earlier we find an original decision of the direct problem of convergent beam ellipsometryl(CBE). This report is devoted to the inverse problem of CBE for the following reflecting system: 1-axisanisotropic film on isotropic substrate. By this technique we have obtained temperature dependencies (4— 300 K) of Cab and c, at fixed laser frequencies 84, 120, 357 cm-1.

Paper Details

Date Published: 30 November 2017
PDF: 2 pages
Proc. SPIE 2104, 18th International Conference on Infrared and Millimeter Waves, 210485 (30 November 2017); doi: 10.1117/12.2298725
Show Author Affiliations
A. B. Sushkov, Institute for Physical Problems (Russian Federation)


Published in SPIE Proceedings Vol. 2104:
18th International Conference on Infrared and Millimeter Waves
James R. Birch; Terence J. Parker, Editor(s)

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