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Proceedings Paper

Far infrared spectroscopy of phonons and plasmons in semiconductor superlattices
Author(s): T. Dumelow
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Paper Abstract

The overall symmetry of both long and short period superlattices is uniaxial, with principal axes, z, parallel,and x and y, normal to the growth direction. Far infrared spectroscopy is a powerful technique for investigatingboth components, ezz and exx = Eyy, of the dielectric function of these structures. In this paper we shall reviewthese techniques and present examples of how they can be used to characterise semiconductor superlattices.Because of the strong absorption due to the phonon modes in superlattices fabricated from compoundsemiconductors, transmission measurements require thinning of the substrate to a few microns in thickness. Thisis difficult to achieve, as well as being destructive, so in all our work reflection spectroscopy is used.

Paper Details

Date Published: 30 November 2017
PDF: 2 pages
Proc. SPIE 2104, 18th International Conference on Infrared and Millimeter Waves, 210470 (30 November 2017); doi: 10.1117/12.2298684
Show Author Affiliations
T. Dumelow, Univ. of Essex (United Kingdom)


Published in SPIE Proceedings Vol. 2104:
18th International Conference on Infrared and Millimeter Waves
James R. Birch; Terence J. Parker, Editor(s)

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