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Proceedings Paper

Modal analysis of microstrip and fine line step discontinuities for microwave and millimeter-wave integrated-circuits applications
Author(s): Cam Nguyen
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Paper Abstract

Modal analysis of microstrip and flnline stepjunctions, commonly seen in microwave and millimeter-waveintegrated circuits, are derived. Numerical results ofscattering parameters are presented in W-band (75 - 110 GHz).There is a good agrrement between our calculated results andpublished data.

Paper Details

Date Published: 30 August 1993
PDF: 2 pages
Proc. SPIE 2104, 18th International Conference on Infrared and Millimeter Waves, 21045A (30 August 1993); doi: 10.1117/12.2298622
Show Author Affiliations
Cam Nguyen, Texas A&M Univ. (United States)


Published in SPIE Proceedings Vol. 2104:
18th International Conference on Infrared and Millimeter Waves
James R. Birch; Terence J. Parker, Editor(s)

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