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Proceedings Paper

Optical characterization of thin films using surface polaritons and surface electromagnetic waves measurements
Author(s): E. V. Alieva
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Paper Abstract

Reflectivity and transmittance measurements are extensively usingfor thin film studies. However for extremely thin films their sensitivityis not enough to obtain good spectra and to derive film dielectricfunction. The new facilities are promised by the application of surfacepolaritons (SP) and surface electromagnetic waves (SEW) for opticalstudies of dielectric, semiconductor and metal surfaces and forspectroscopy of thin films on them [1]. The surface polaritons andplasmons being localized exactly on the surface (with the maximum ofelectric field on it) are extremely sensitive to the presence of thinfilms being the monolayers or submonolayers.

Paper Details

Date Published: 30 August 1993
PDF: 2 pages
Proc. SPIE 2104, 18th International Conference on Infrared and Millimeter Waves, 210449 (30 August 1993); doi: 10.1117/12.2298585
Show Author Affiliations
E. V. Alieva, Institute of Spectroscopy (Russian Federation)


Published in SPIE Proceedings Vol. 2104:
18th International Conference on Infrared and Millimeter Waves
James R. Birch; Terence J. Parker, Editor(s)

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