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Proceedings Paper

Frequency-dependent characteristics of thick microstrip lines in lossy multilayered dielectric media
Author(s): J. R. Souza
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Paper Abstract

The Spectral Domain Approach (SDA) is used for a rigorous full-wave analysis of thick microstrip linesembedded in lossy multilayered dielectric media. The effects of the conductor thickness on the propagationconstant and characteristic impedance are investigated.

Paper Details

Date Published: 30 August 1993
PDF: 2 pages
Proc. SPIE 2104, 18th International Conference on Infrared and Millimeter Waves, 210447 (30 August 1993); doi: 10.1117/12.2298583
Show Author Affiliations
J. R. Souza, Pontifical Catholic Univ. of Rio de Janeiro (Brazil)

Published in SPIE Proceedings Vol. 2104:
18th International Conference on Infrared and Millimeter Waves
James R. Birch; Terence J. Parker, Editor(s)

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