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Proceedings Paper

Characterization of materials by submillimeter multibeam techniques
Author(s): B. P. Gorshunov
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Paper Abstract

Use of different multilayer resonance structures in quasioptical submillimeter (SBMM) spectroscopy gives an•ffective way of increasing the sensitivity of measuring schemes due to multiple interaction of the testing radiationwith the sample. We present below three main kinds of interferometric structures used in SBMM quasiopticalspectroscopy which allow direct determination of any optical constant of the sample.

Paper Details

Date Published: 30 August 1993
PDF: 2 pages
Proc. SPIE 2104, 18th International Conference on Infrared and Millimeter Waves, 210429 (30 August 1993); doi: 10.1117/12.2298513
Show Author Affiliations
B. P. Gorshunov, Institute for General Physics (Russian Federation)


Published in SPIE Proceedings Vol. 2104:
18th International Conference on Infrared and Millimeter Waves
James R. Birch; Terence J. Parker, Editor(s)

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