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Proceedings Paper

Far infrared reflectance standards
Author(s): J. R. Birch
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Paper Abstract

A method developed for the absolute determination of complex reflectivity is discussedin terms of reflection standards for the 3 to 600 cm-1 spectral region. These can beprimary standards based on transparent materials such as silicon, or secondary, opaquestandards such as thin aluminium films, with or without protective overcoating.

Paper Details

Date Published: 30 August 1993
PDF: 2 pages
Proc. SPIE 2104, 18th International Conference on Infrared and Millimeter Waves, 210423 (30 August 1993); doi: 10.1117/12.2298507
Show Author Affiliations
J. R. Birch, National Physical Lab. (United Kingdom)

Published in SPIE Proceedings Vol. 2104:
18th International Conference on Infrared and Millimeter Waves
James R. Birch; Terence J. Parker, Editor(s)

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