Share Email Print
cover

Proceedings Paper

Characterization of unilateral finline considering the conductor thickness
Author(s): Humberto Cesar Chaves Fernandes
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

The theories and numerical results are presented to the effective dielectric constant and characteristic impedance of unilateral finline structures, considering the conductor thickness of the metal fins. The full wave analysis of the transverse transmission line-TTL, that is a direct method, is used. These numerical results are interesting to be used in practical experiences by considering the conductor thick- ness.

Paper Details

Date Published: 14 December 1992
PDF: 2 pages
Proc. SPIE 1929, 17th International Conference on Infrared and Millimeter Waves, 19296N (14 December 1992); doi: 10.1117/12.2298356
Show Author Affiliations
Humberto Cesar Chaves Fernandes, Federal Univ. of Rio Grande do Norte (Brazil)


Published in SPIE Proceedings Vol. 1929:
17th International Conference on Infrared and Millimeter Waves
Richard J. Temkin, Editor(s)

© SPIE. Terms of Use
Back to Top