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Proceedings Paper

Surface emitting characteristics of silicon waveguides
Author(s): N. Urimindi
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Paper Abstract

The objective of the present paper is to demonstrate surface emitting characteristics of silicon waveguides in the millimeter-wave frequency band. Waveguides used in the experiment are rectangular slabs of high resistivity silicon ( 30,000 A series of perturbations on the silicon waveguide are required to provide a radiating surface. The second Bragg frequency is fixed at 90 GHz from which the grating period, height and the duty cycle were calculated. A rectangular grating with period A = 1.08 mm, height = 0.35 mm, and duty cycle = 0.46 was etched on the surface of the silicon slab. The ends of the waveguide were tapered for efficient coupling of power to and from the metallic waveguides. Experiments are performed to measure the attenuation, dispersion and the radiation characteristics of the said waveguides. The test setup was' used to monitor the frequency, radiation angle, and the radiated power. Measurements are made over a band of frequencies around the second Bragg frequency. We have scanned the detector from 88-95 GHz and were able to observe the change in the attenuation constant, dispersion relation and the far-field radiation pattern. The observed experimental results are found to be in good agreement with their theoretical counterparts. From these results we were able to verify the grating theory.

Paper Details

Date Published: 14 December 1992
PDF: 2 pages
Proc. SPIE 1929, 17th International Conference on Infrared and Millimeter Waves, 19295S (14 December 1992); doi: 10.1117/12.2298325
Show Author Affiliations
N. Urimindi, Southern Methodist Univ. (United States)

Published in SPIE Proceedings Vol. 1929:
17th International Conference on Infrared and Millimeter Waves
Richard J. Temkin, Editor(s)

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