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Proceedings Paper

The reliability of planar GaAs Schottky diodes
Author(s): Jodi L. Bowers
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Paper Abstract

Planar GaAs Schottky barrier mixer diodes are now being used in a variety of applications at millimeter and submillimeter wavelengths. Since these devices are being considered for space applications, device reliability is a critical issue. This paper presents first results from accelerated life testing of planar mixer diodes.

Paper Details

Date Published: 14 December 1992
PDF: 2 pages
Proc. SPIE 1929, 17th International Conference on Infrared and Millimeter Waves, 192930 (14 December 1992); doi: 10.1117/12.2298225
Show Author Affiliations
Jodi L. Bowers, Univ. of Virginia (United States)

Published in SPIE Proceedings Vol. 1929:
17th International Conference on Infrared and Millimeter Waves
Richard J. Temkin, Editor(s)

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