Share Email Print
cover

Proceedings Paper

The reliability of planar GaAs Schottky diodes
Author(s): Jodi L. Bowers
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Planar GaAs Schottky barrier mixer diodes are now being used in a variety of applications at millimeter and submillimeter wavelengths. Since these devices are being considered for space applications, device reliability is a critical issue. This paper presents first results from accelerated life testing of planar mixer diodes.

Paper Details

Date Published: 14 December 1992
PDF: 2 pages
Proc. SPIE 1929, 17th International Conference on Infrared and Millimeter Waves, 192930 (14 December 1992); doi: 10.1117/12.2298225
Show Author Affiliations
Jodi L. Bowers, Univ. of Virginia (United States)


Published in SPIE Proceedings Vol. 1929:
17th International Conference on Infrared and Millimeter Waves
Richard J. Temkin, Editor(s)

© SPIE. Terms of Use
Back to Top