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Proceedings Paper

On-wafer phase locking of a microwave oscillator for high-speed optical waveform sampling
Author(s): Eve A. Chauchard
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Paper Abstract

Optical techniques such as electro-optic sampling and photoconductive sampling are currently used to characterize microwave and millimeterwave devices. These techniques are extremely important to the microwave scientific community because they offer several advantages over conventional network analyzer measurements. Namely, they have broader band capability (over 100 GHz) and permit on-wafer, non-invasive measurements. Jitter-free time synchronization between the microwave signal and the laser pulse train is essential to these sampling techniques. Several approaches to realize synchronization have been reported. We developed one possible approach whereby a narrow electrical pulse (with broadband content) is generated on-wafer, using a fast photoconductive switch [1]. Measurements performed in the time domain are then converted to S-parameter measurements by Fourier transformation.

Paper Details

Date Published: 1 October 1991
PDF: 2 pages
Proc. SPIE 1576, 16th International Conference on Infrared and Millimeter Waves, 15764U (1 October 1991); doi: 10.1117/12.2297887
Show Author Affiliations
Eve A. Chauchard, Univ. of Maryland, College Park (United States)

Published in SPIE Proceedings Vol. 1576:
16th International Conference on Infrared and Millimeter Waves
Minh Quang Tran, Editor(s)

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