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Proceedings Paper

Infrared properties of a- and c-oriented epitaxial YBCO films
Author(s): A. N. Ivlev
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Paper Abstract

Two YBCO oriented epitaxial films on SrTiO3 substrates prepared by laser ablation technique were used for mid-infrared optical Investigations. Both ac-ori rented (i.e. a (or b) and c lattice vectors lie in the substrate plane) and ab-oriented films were deposited and annealed at the same technological cycle and had thickness about 4000A. Special attention was paid to the determination of quality and orientation. X-rays difraction showed only presence of 00n peaks for (ab)-orientation and 110, 220 peaks for (ac)-film. Lattice constants from X-rays measurements were used to calculate the oxigen contents of films by empyrical formula 7−δ=76.4−5.95⋅c [A], which gives δ≈0.08+0.12.

Paper Details

Date Published: 1 October 1991
PDF: 2 pages
Proc. SPIE 1576, 16th International Conference on Infrared and Millimeter Waves, 15760E (1 October 1991); doi: 10.1117/12.2297727
Show Author Affiliations
A. N. Ivlev, Institute for Physical Problems (Russian Federation)

Published in SPIE Proceedings Vol. 1576:
16th International Conference on Infrared and Millimeter Waves
Minh Quang Tran, Editor(s)

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