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Characterization of technical surfaces by structure function analysis
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Paper Abstract

The structure function is a tool for characterizing technical surfaces that exhibits a number of advantages over Fourierbased analysis methods. So it is optimally suited for analyzing the height distributions of surfaces measured by full-field non-contacting methods. The structure function is thus a useful method to extract global or local criteria like e. g. periodicities, waviness, lay, or roughness to analyze and evaluate technical surfaces. After the definition of line- and area-structure function and offering effective procedures for their calculation this paper presents examples using simulated and measured data of technical surfaces including aircraft parts.

Paper Details

Date Published: 27 March 2018
PDF: 8 pages
Proc. SPIE 10599, Nondestructive Characterization and Monitoring of Advanced Materials, Aerospace, Civil Infrastructure, and Transportation XII, 1059924 (27 March 2018); doi: 10.1117/12.2296309
Show Author Affiliations
Michael Kalms, Bremer Institut für angewandte Strahltechnik GmbH (Germany)
Thomas Kreis, Univ. Bremen (Germany)
Ralf B. Bergmann, Bremer Institut für angewandte Strahltechnik GmbH (Germany)
Univ. Bremen (Germany)
MAPEX Ctr. for Materials and Processes (Germany)


Published in SPIE Proceedings Vol. 10599:
Nondestructive Characterization and Monitoring of Advanced Materials, Aerospace, Civil Infrastructure, and Transportation XII
Peter J. Shull, Editor(s)

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