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Proceedings Paper

Analysis on the dynamic error for optoelectronic scanning coordinate measurement network
Author(s): Shendong Shi; Linghui Yang; Jiarui Lin; Siyang Guo; Yongjie Ren
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Paper Abstract

Large-scale dynamic three-dimension coordinate measurement technique is eagerly demanded in equipment manufacturing. Noted for advantages of high accuracy, scale expandability and multitask parallel measurement, optoelectronic scanning measurement network has got close attention. It is widely used in large components jointing, spacecraft rendezvous and docking simulation, digital shipbuilding and automated guided vehicle navigation. At present, most research about optoelectronic scanning measurement network is focused on static measurement capacity and research about dynamic accuracy is insufficient. Limited by the measurement principle, the dynamic error is non-negligible and restricts the application. The workshop measurement and positioning system is a representative which can realize dynamic measurement function in theory. In this paper we conduct deep research on dynamic error resources and divide them two parts: phase error and synchronization error. Dynamic error model is constructed. Based on the theory above, simulation about dynamic error is carried out. Dynamic error is quantized and the rule of volatility and periodicity has been found. Dynamic error characteristics are shown in detail. The research result lays foundation for further accuracy improvement.

Paper Details

Date Published: 12 January 2018
PDF: 9 pages
Proc. SPIE 10621, 2017 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 106210N (12 January 2018); doi: 10.1117/12.2296263
Show Author Affiliations
Shendong Shi, Tianjin Univ. (China)
Linghui Yang, Tianjin Univ. (China)
Jiarui Lin, Tianjin Univ. (China)
Siyang Guo, Tianjin Univ. (China)
Yongjie Ren, Tianjin Univ. (China)


Published in SPIE Proceedings Vol. 10621:
2017 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems
Jigui Zhu; Hwa-Yaw Tam; Kexin Xu; Hai Xiao; Liquan Dong, Editor(s)

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