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Proceedings Paper • Open Access

Full field x-ray fluorescence imaging using micro pore optics for planetary surface exploration
Author(s): P. Sarrazin; D. F. Blake; M. Gailhanou; P. Walter; E. Schyns; F. Marchis; K. Thompson; T. Bristow

Paper Abstract

Many planetary surface processes leave evidence as small features in the sub-millimetre scale. Current planetary X-ray fluorescence spectrometers lack the spatial resolution to analyze such small features as they only provide global analyses of areas <100 mm2. A micro-XRF spectrometer will be deployed on the NASA Mars 2020 rover to analyze spots as small as 120μm.

Paper Details

Date Published: 25 September 2017
PDF: 8 pages
Proc. SPIE 10562, International Conference on Space Optics — ICSO 2016, 105622G (25 September 2017); doi: 10.1117/12.2296170
Show Author Affiliations
P. Sarrazin, SETI Institute (United States)
D. F. Blake, NASA Ames Research Ctr. (United States)
M. Gailhanou, IM2NP, Aix-Marseille Univ., CNRS (Switzerland)
P. Walter, LAMS, Sorbonne Univ., CNRS-UPMC (France)
E. Schyns, PHOTONIS France S.A.S. (France)
F. Marchis, SETI Institute (United States)
K. Thompson, SETI Institute (United States)
T. Bristow, NASA Ames Research Ctr. (United States)


Published in SPIE Proceedings Vol. 10562:
International Conference on Space Optics — ICSO 2016
Bruno Cugny; Nikos Karafolas; Zoran Sodnik, Editor(s)

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