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Proceedings Paper • Open Access

Development and optical performance tests of the Si immersed grating demonstrator for E-ELT METIS

Paper Abstract

Immersed gratings offer several advantages over conventional gratings: more compact spectrograph designs, and by using standard semiconductor industry techniques, higher diffraction-efficiency and lower stray-light can be achieved. We present the optical tests of the silicon immersed grating demonstrator for the Mid-infrared E-ELT Imager and Spectrograph, METIS. We detail the interferometric tests that were done to measure the wavefront-error and present the results of the throughput and stray-light measurements. We also elaborate on the challenges encountered and lessons learned during the immersed grating demonstrator test campaign that helped us to improve the fabrication processes of the grating patterning on the wafer.

Paper Details

Date Published: 25 September 2017
PDF: 9 pages
Proc. SPIE 10562, International Conference on Space Optics — ICSO 2016, 1056257 (25 September 2017); doi: 10.1117/12.2296128
Show Author Affiliations
Ramon Navarro, ASTRON (Netherlands)
Tibor Agócs, ASTRON (Netherlands)
Lars Venema, ASTRON (Netherlands)
Aaldert H. van Amerongen, SRON Netherlands Institute for Space Research (Netherlands)
Michiel Rodenhuis, Leiden Univ. (Netherlands)
Ruud W. M. Hoogeveen, SRON Netherlands Institute for Space Research (Netherlands)
Tonny Coppens, SRON Netherlands Institute for Space Research (Netherlands)
Bernhard R. Brandl, Leiden Univ. (Netherlands)
Ramon Vink, European Space Agency (Netherlands)


Published in SPIE Proceedings Vol. 10562:
International Conference on Space Optics — ICSO 2016
Bruno Cugny; Nikos Karafolas; Zoran Sodnik, Editor(s)

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