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Proceedings Paper

Real-time in-chip phase noise characterization of digitally controlled swept laser source
Author(s): Zheyi Yao; Zhen Chen; Gerald Hefferman; Tao Wei
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Paper Abstract

Distributed optical fiber sensors are increasingly utilized method of distributed strain and temperature sensing, and the swept laser source plays an significant role in these applications. However, there is dynamic frequency-noise as the laser sweeping. In this paper, we proposed and experimentally demonstrated a real-time in-situ phase noise detecting method in a field programmable gate array (FPGA) chip, which permits accurate and insightful investigation of laser stability. This method takes only 1 clock cycle to capture the phase noise.

Paper Details

Date Published: 10 April 2018
PDF: 4 pages
Proc. SPIE 10598, Sensors and Smart Structures Technologies for Civil, Mechanical, and Aerospace Systems 2018, 105982M (10 April 2018); doi: 10.1117/12.2295858
Show Author Affiliations
Zheyi Yao, The Univ. of Rhode Island (United States)
Zhen Chen, The Univ. of Rhode Island (United States)
Gerald Hefferman, Brown Univ. (United States)
The Univ. of Rhode Island (United States)
Tao Wei, The Univ. of Rhode Island (United States)


Published in SPIE Proceedings Vol. 10598:
Sensors and Smart Structures Technologies for Civil, Mechanical, and Aerospace Systems 2018
Hoon Sohn, Editor(s)

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