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Proceedings Paper

Femtosecond Z-scan measurements of the nonlinear refractive index of fused silica
Author(s): Lin Zhang; Zhendong Shi; Hua Ma; Huan Ren; Quan Yuan; Yurong Ma; Xiaoxuan Feng; Bo Chen; Yi Yang
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Paper Abstract

Z-scan technology is a popular experimental technique for determining the nonlinear refractive index of the material. However, it encounters a great difficulty in measuring the weak nonlinear material like fused silica which is about two orders of magnitude below the nonlinear refractive index of most of the materials studied with the nanosecond and picosecond Z-scan methods. In this case, the change of refractive index introduced by accumulation of thermal effects cannot be neglected. In order to have a reliable measurement of the nonlinear refractive index, a metrology bench based on the femtosecond Z-scan technology is developed. The intensity modulation component and the differential measurement system are applied to guarantee the accuracy of the measuring system. Based on the femtosecond Z-scan theory, the femtosecond laser Z-scan technique is performed on fused silica, and the nonlinear refractive index of Fused silica is determined to be 9.2039×10-14esu for 800nm, 37fs pulse duration at I0=50GW/cm2 with a good repeatability of 6.7%.

Paper Details

Date Published: 12 January 2018
PDF: 11 pages
Proc. SPIE 10621, 2017 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 106210H (12 January 2018); doi: 10.1117/12.2295559
Show Author Affiliations
Lin Zhang, China Academy of Engineering Physics (China)
Zhendong Shi, China Academy of Engineering Physics (China)
Hua Ma, China Academy of Engineering Physics (China)
Huan Ren, China Academy of Engineering Physics (China)
Quan Yuan, China Academy of Engineering Physics (China)
Yurong Ma, China Academy of Engineering Physics (China)
Xiaoxuan Feng, China Academy of Engineering Physics (China)
Bo Chen, China Academy of Engineering Physics (China)
Yi Yang, China Academy of Engineering Physics (China)


Published in SPIE Proceedings Vol. 10621:
2017 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems
Jigui Zhu; Hwa-Yaw Tam; Kexin Xu; Hai Xiao; Liquan Dong, Editor(s)

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