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Proceedings Paper

A novel automatic full-scale inspecting system for banknote printing plates
Author(s): Jian Zhang; Li Feng; Jibing Lu; Qingwang Qin; Liquan Liu; Huina Liu
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Paper Abstract

Quality assurance of banknote printing plates is an important issue for the corporation which produces them. Every plate must be checked carefully and entirely before it's sent to the banknote printing factory. Previously the work is done by specific workers, usually with the help of powder and magnifiers, and often lasts for 3 to 4 hours for a 5*7 plate with the size of about 650*500 square millimeters. Now we have developed an automatic inspecting system to replace human work. The system mainly includes a stable platform, an electrical subsystem and an inspecting subsystem. A microscope held by the crossbeam can move around in the x-y-z space over the platform. A digital camera combined with the microscope captures gray digital images of the plate. The size of each digital image is 2672*4008, and each pixel corresponds to about 2.9*2.9 square microns area of the plate. The plate is inspected by each unit, and corresponding images are captured at the same relative position. Thousands of images are captured for one plate (for example, 4200 (120*5*7) for a 5*7 plate). The inspecting model images are generated from images of qualified plates, and then used to inspect indeterminate plates. The system costs about 64 minutes to inspect a plate, and identifies obvious defects.

Paper Details

Date Published: 10 January 2018
PDF: 8 pages
Proc. SPIE 10616, 2017 International Conference on Optical Instruments and Technology: Optical Systems and Modern Optoelectronic Instruments, 1061606 (10 January 2018); doi: 10.1117/12.2295516
Show Author Affiliations
Jian Zhang, People's Bank of China (China)
Li Feng, People's Bank of China (China)
Jibing Lu, People's Bank of China (China)
Qingwang Qin, People's Bank of China (China)
Liquan Liu, People's Bank of China (China)
Huina Liu, People's Bank of China (China)


Published in SPIE Proceedings Vol. 10616:
2017 International Conference on Optical Instruments and Technology: Optical Systems and Modern Optoelectronic Instruments
Yongtian Wang; Baohua Jia; Kimio Tatsuno; Liquan Dong, Editor(s)

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