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Proceedings Paper

Calibration of photo-detector’s absolute spectral responsivity in the wavelength range 300 nm to 1000 nm
Author(s): Haifeng Meng; Limin Xiong; Nan Xu; Yingwei He; Junchao Zhang; Bifeng Zhang
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Paper Abstract

Various kinds of photo-detectors based on different materials have been successfully developed to expand the horizon of human eye. Spectral responsivity is the most important technical parameter for photo-detectors, which can mirror the converting ability of optical signal to electric current. Its measurement accuracy is critical for the development and research of photo-detecting field. In this paper, we will introduce the facility for photo-detector’s spectral responsivity calibration in the wavelength range of 300 nm to 1000 nm, built in National Institute of Metrology (NIM), China. Measurement uncertainty is analyzed at the wavelength 500 nm as an example. By adopting comparison method, choosing reference detectors with known standard value and traceable to SI units through upper level standards, we demonstrated a reliable measurement procedure for absolute spectral responsivity of photo-detectors.

Paper Details

Date Published: 12 January 2018
PDF: 6 pages
Proc. SPIE 10621, 2017 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 106211T (12 January 2018); doi: 10.1117/12.2295479
Show Author Affiliations
Haifeng Meng, National Institute of Metrology (China)
Limin Xiong, National Institute of Metrology (China)
Nan Xu, National Institute of Metrology (China)
Yingwei He, National Institute of Metrology (China)
Junchao Zhang, National Institute of Metrology (China)
Bifeng Zhang, National Institute of Metrology (China)


Published in SPIE Proceedings Vol. 10621:
2017 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems
Jigui Zhu; Hwa-Yaw Tam; Kexin Xu; Hai Xiao; Liquan Dong, Editor(s)

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