Share Email Print
cover

Proceedings Paper

Temporal overlap estimation based on interference spectrum in CARS microscopy
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Coherent Anti-Stokes Raman Scattering (CARS) microscopy has attracted lots of attention because of the advantages, such as noninvasive, label-free, chemical specificity, intrinsic three-dimension spatial resolution and so on. However, the temporal overlap of pump and Stokes has not been solved owing to the ultrafast optical pulse used in CARS microscopy. We combine interference spectrum of residual pump in Stokes path and nonlinear Schrodinger equation (NLSE) to realize the temporal overlap of pump pulse and Stokes pulse. At first, based on the interference spectrum of pump pulse and residual pump in Stokes path, the optical delay is defined when optical path difference between pump path and Stokes path is zero. Then the relative optical delay between Stokes pulse and residual pump in PCF can be calculated by NLSE. According to the spectrum interference and NLSE, temporal overlap of pump pulse and Stokes pulse will be realized easily and the imaging speed will be improved in CARS microscopy.

Paper Details

Date Published: 12 January 2018
PDF: 9 pages
Proc. SPIE 10620, 2017 International Conference on Optical Instruments and Technology: Optoelectronic Imaging/Spectroscopy and Signal Processing Technology, 1062008 (12 January 2018); doi: 10.1117/12.2295476
Show Author Affiliations
Yongning Zhang, Tianjin Univ. (China)
Junfeng Jiang, Tianjin Univ. (China)
Kun Liu, Tianjin Univ. (China)
Can Huang, Tianjin Univ. (China)
Shuang Wang, Tianjin Univ. (China)
Xuezhi Zhang, Tianjin Univ. (China)
Tiegen Liu, Tianjin Univ. (China)


Published in SPIE Proceedings Vol. 10620:
2017 International Conference on Optical Instruments and Technology: Optoelectronic Imaging/Spectroscopy and Signal Processing Technology
Guohai Situ; Xun Cao; Wolfgang Osten; Liquan Dong, Editor(s)

© SPIE. Terms of Use
Back to Top