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Proceedings Paper

Network placement optimization for large-scale distributed system
Author(s): Yu Ren; Fangfang Liu; Yunxia Fu; Zheng Zhou
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Paper Abstract

The network geometry strongly influences the performance of the distributed system, i.e., the coverage capability, measurement accuracy and overall cost. Therefore the network placement optimization represents an urgent issue in the distributed measurement, even in large-scale metrology. This paper presents an effective computer-assisted network placement optimization procedure for the large-scale distributed system and illustrates it with the example of the multi-tracker system. To get an optimal placement, the coverage capability and the coordinate uncertainty of the network are quantified. Then a placement optimization objective function is developed in terms of coverage capabilities, measurement accuracy and overall cost. And a novel grid-based encoding approach for Genetic algorithm is proposed. So the network placement is optimized by a global rough search and a local detailed search. Its obvious advantage is that there is no need for a specific initial placement. At last, a specific application illustrates this placement optimization procedure can simulate the measurement results of a specific network and design the optimal placement efficiently.

Paper Details

Date Published: 12 January 2018
PDF: 9 pages
Proc. SPIE 10621, 2017 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 106211S (12 January 2018); doi: 10.1117/12.2295376
Show Author Affiliations
Yu Ren, Shanghai Institute of Measurement and Testing Technology for Qualitative and Technical Supervision (China)
Fangfang Liu, Shanghai Institute of Measurement and Testing Technology for Qualitative and Technical Supervision (China)
Yunxia Fu, Shanghai Institute of Measurement and Testing Technology for Qualitative and Technical Supervision (China)
Zheng Zhou, Shanghai Institute of Measurement and Testing Technology for Qualitative and Technical Supervision (China)


Published in SPIE Proceedings Vol. 10621:
2017 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems
Jigui Zhu; Hwa-Yaw Tam; Kexin Xu; Hai Xiao; Liquan Dong, Editor(s)

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