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Proceedings Paper

A method of noise reduction in heterodyne interferometric vibration metrology by combining auto-correlation analysis and spectral filtering
Author(s): Hongliang Hao; Wen Xiao; Zonghui Chen; Lan Ma; Feng Pan
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Paper Abstract

Heterodyne interferometric vibration metrology is a useful technique for dynamic displacement and velocity measurement as it can provide a synchronous full-field output signal. With the advent of cost effective, high-speed real-time signal processing systems and software, processing of the complex signals encountered in interferometry has become more feasible. However, due to the coherent nature of the laser sources, the sequence of heterodyne interferogram are corrupted by a mixture of coherent speckle and incoherent additive noise, which can severely degrade the accuracy of the demodulated signal and the optical display. In this paper, a new heterodyne interferometric demodulation method by combining auto-correlation analysis and spectral filtering is described leading to an expression for the dynamic displacement and velocity of the object under test that is significantly more accurate in both the amplitude and frequency of the vibrating waveform. We present a mathematical model of the signals obtained from interferograms that contain both vibration information of the measured objects and the noise. A simulation of the signal demodulation process is presented and used to investigate the noise from the system and external factors. The experimental results show excellent agreement with measurements from a commercial Laser Doppler Velocimetry (LDV).

Paper Details

Date Published: 10 January 2018
PDF: 8 pages
Proc. SPIE 10616, 2017 International Conference on Optical Instruments and Technology: Optical Systems and Modern Optoelectronic Instruments, 106161D (10 January 2018); doi: 10.1117/12.2295331
Show Author Affiliations
Hongliang Hao, Beihang Univ. (China)
Wen Xiao, Beihang Univ. (China)
Zonghui Chen, Beihang Univ. (China)
Lan Ma, Beihang Univ. (China)
Feng Pan, Beihang Univ. (China)


Published in SPIE Proceedings Vol. 10616:
2017 International Conference on Optical Instruments and Technology: Optical Systems and Modern Optoelectronic Instruments
Yongtian Wang; Baohua Jia; Kimio Tatsuno; Liquan Dong, Editor(s)

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