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Proceedings Paper

An in-situ measuring method for planar straightness error
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Paper Abstract

According to some current problems in the course of measuring the plane shape error of workpiece, an in-situ measuring method based on laser triangulation is presented in this paper. The method avoids the inefficiency of traditional methods like knife straightedge as well as the time and cost requirements of coordinate measuring machine(CMM). A laser-based measuring head is designed and installed on the spindle of a numerical control(NC) machine. The measuring head moves in the path planning to measure measuring points. The spatial coordinates of the measuring points are obtained by the combination of the laser triangulation displacement sensor and the coordinate system of the NC machine, which could make the indicators of measurement come true. The method to evaluate planar straightness error adopts particle swarm optimization(PSO). To verify the feasibility and accuracy of the measuring method, simulation experiments were implemented with a CMM. Comparing the measurement results of measuring head with the corresponding measured values obtained by composite measuring machine, it is verified that the method can realize high-precise and automatic measurement of the planar straightness error of the workpiece.

Paper Details

Date Published: 12 January 2018
PDF: 12 pages
Proc. SPIE 10621, 2017 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 106211J (12 January 2018); doi: 10.1117/12.2295244
Show Author Affiliations
Xi Chen, Tianjin Univ. (China)
Luhua Fu, Tianjin Univ. (China)
Tongyu Yang, Tianjin Univ. (China)
Changku Sun, Tianjin Univ. (China)
Zhong Wang, Tianjin Univ. (China)
Yan Zhao, Tianjin Univ. (China)
Changjie Liu, Tianjin Univ. (China)


Published in SPIE Proceedings Vol. 10621:
2017 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems
Jigui Zhu; Hwa-Yaw Tam; Kexin Xu; Hai Xiao; Liquan Dong, Editor(s)

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