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Proceedings Paper

Compensation of sampling error in frequency scanning interferometry
Author(s): Yue Shang; Jiarui Lin; Linghui Yang; Yongjie Ren
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Paper Abstract

Absolute distance measurement techniques are of significant interest in the field of large volume metrology. Ones which could offer an ability of ADM and high accuracy will improve the efficiency and the quality of large assemblies. Frequency scanning interferometry (FSI) is a kind of ADM technique which use a variable synthetic-wavelength achieved by tuning the optical frequency continuously. FSI could offer a relative accuracy of several ppm in a range of tens of meters. In a FSI ranging system, it is necessary to get knowledge of the tuning range of optical frequency, which could be done by using of gas absorption cell, femtosecond laser comb, F-P etalon and the most used: a predicted auxiliary interferometer. As the result of the measurement is calculated by the tuning range of optical frequency, a length drift of the auxiliary interferometer will make a contribution in error of the result. Analysis of sampling error caused by the drift of the auxiliary interferometer has been done and a real-time compensation system has been proposed to minimize the drift of the auxiliary interferometer. The simulation has proved the analysis and the error has been decreased.

Paper Details

Date Published: 12 January 2018
PDF: 7 pages
Proc. SPIE 10621, 2017 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 106210K (12 January 2018); doi: 10.1117/12.2295243
Show Author Affiliations
Yue Shang, Tianjin Univ. (China)
Jiarui Lin, Tianjin Univ. (China)
Linghui Yang, Tianjin Univ. (China)
Yongjie Ren, Tianjin Univ. (China)


Published in SPIE Proceedings Vol. 10621:
2017 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems
Jigui Zhu; Hwa-Yaw Tam; Kexin Xu; Hai Xiao; Liquan Dong, Editor(s)

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