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Proceedings Paper

Distributed dynamic stress sensor based on white light interferometer
Author(s): Hongxia Zhang; Yuyao Wang; Guoqiang Wen; Dagong Jia; Tiegen Liu
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Paper Abstract

In this paper, we proposed a distributed stress sensor based on white light interferometer. The measurement including two steps: firstly, the moveable mirror of Michelson interferometer scans to detect the interferogram, and the position of dynamic stress can be obtained from the interferogram. Secondly, the moveable mirror of Michelson interferometer adjusted to compensate the optical path difference generated in the polarization maintaining fiber, and the photodiode detect the interference intensity. By applying wavelet transform to the detect signal, the frequency of dynamic stress can be demodulate. In our experiments, the measurement errors for 100 Hz and 1 kHz sinusoidal stress are 0.26 Hz and 0.3 Hz, respectively. And 20 Hz - 60 Hz chirp signal is also measured successfully. In the end, the harmonics in the time frequency distribution image and the factors resulting in the measurement error are discussed in detail.

Paper Details

Date Published: 10 January 2018
PDF: 6 pages
Proc. SPIE 10618, 2017 International Conference on Optical Instruments and Technology: Advanced Optical Sensors and Applications, 1061802 (10 January 2018); doi: 10.1117/12.2295152
Show Author Affiliations
Hongxia Zhang, Tianjin Univ. (China)
Key Lab. of Optoelectronics Information and Technical Science (China)
Yuyao Wang, Tianjin Univ. (China)
Key Lab. of Optoelectronics Information and Technical Science (China)
Guoqiang Wen, Tianjin Univ. (China)
Key Lab. of Optoelectronics Information and Technical Science (China)
Dagong Jia, Tianjin Univ. (China)
Key Lab. of Optoelectronics Information and Technical Science (China)
Tiegen Liu, Tianjin Univ. (China)
Key Lab. of Optoelectronics Information and Technical Science (China)


Published in SPIE Proceedings Vol. 10618:
2017 International Conference on Optical Instruments and Technology: Advanced Optical Sensors and Applications
Xuping Zhang; Hai Xiao; Francisco Javier Arregui; Liquan Dong, Editor(s)

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