Share Email Print

Proceedings Paper

Feature extraction and processing of the signal in opto-electronic image measurement
Author(s): Wanpeng Ji
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Based on related bibliographys and repesences on the image measurement and the practise of author in science and technique research, this paper treat various methods for feature extraction and application for these methods. The indirect binary is a new concept for come up with author. It lends itself to on -line geometric size measurement for heat workpiece in furnace and for glass ribbon width or edge location in the molten tin bath using float process.

Paper Details

Date Published: 1 July 1990
PDF: 2 pages
Proc. SPIE 1230, International Conference on Optoelectronic Science and Engineering '90, 12306C (1 July 1990); doi: 10.1117/12.2294865
Show Author Affiliations
Wanpeng Ji, Shenyang Polytechnic Univ. (China)

Published in SPIE Proceedings Vol. 1230:
International Conference on Optoelectronic Science and Engineering '90
DaHeng Wang, Editor(s)

© SPIE. Terms of Use
Back to Top