Share Email Print
cover

Proceedings Paper

The application of improved Fourier transform profilometry
Author(s): Jian Li
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

3-D object shape can be profiled by using optical noncontact measurement methods, such as improved Fourier transform profilometry, etc. These methods restore the object shape through analyzing the continuous phase distribution of an optical structured field that is modulated by the shape. However, in practice, many shapes to be measured have steep height variation and may cause shadows in the modulated phase distribution. Such kind of object shape can not be restored. We propose a method to solve this problem. With this method, the improved Fourier transform profilometry can be used in many areas. This paper describes the theory.

Paper Details

Date Published: 1 July 1990
PDF: 2 pages
Proc. SPIE 1230, International Conference on Optoelectronic Science and Engineering '90, 123068 (1 July 1990); doi: 10.1117/12.2294861
Show Author Affiliations
Jian Li, Sichuan Univ. (China)


Published in SPIE Proceedings Vol. 1230:
International Conference on Optoelectronic Science and Engineering '90
DaHeng Wang, Editor(s)

© SPIE. Terms of Use
Back to Top