Share Email Print
cover

Proceedings Paper

Talbot projection Moire topography and it's automatic fringe process using phase shift methods
Author(s): Ruowei Gu
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

A novel profilometry---Talbot projection moire topography is demonstrated in this paper, which allows to take 3-D moire measurement under non-dark-room condition while the projecting lens can be eliminated. The moire contours are converted to 3-D data using phase shift methods with an image data processing system. The results of a fundamental experiment and its accuracy analysis are presented also.

Paper Details

Date Published: 1 July 1990
PDF: 3 pages
Proc. SPIE 1230, International Conference on Optoelectronic Science and Engineering '90, 123067 (1 July 1990); doi: 10.1117/12.2294860
Show Author Affiliations
Ruowei Gu, Beijing Institute of Technology (China)


Published in SPIE Proceedings Vol. 1230:
International Conference on Optoelectronic Science and Engineering '90
DaHeng Wang, Editor(s)

© SPIE. Terms of Use
Back to Top