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Proceedings Paper

A new method of laser twice diffraction and interference for precisely measuring straightness of large-size objects
Author(s): Yu Li
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Paper Abstract

Straightness is an index which limits the deviation of an actul line from an ideal line. Properly mearuring straightness is a basic means to evaluate the precision condition of the shape and position of a machine part. Measurement of straightness is of great importance in a mechanical system. The problem of how to precisely measure straightness of a small-size object has been solved, but that of how to dynamically and automatically, and with high resolution, measure straightness of large- size objects is still being studied and tried. Now we present a new method of laser twice diffraction and inteference for measuring straightness, with a measuring range of dozens of meters, a resolution of ,u m order. This new method is of low cost and easy to get popularized.

Paper Details

Date Published: 1 July 1990
PDF: 3 pages
Proc. SPIE 1230, International Conference on Optoelectronic Science and Engineering '90, 12304C (1 July 1990); doi: 10.1117/12.2294793
Show Author Affiliations
Yu Li, Taiyuan Univ. of Technology (China)


Published in SPIE Proceedings Vol. 1230:
International Conference on Optoelectronic Science and Engineering '90
DaHeng Wang, Editor(s)

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