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Proceedings Paper

A new method to laser-CCD scanning system applied to seamtracking
Author(s): Shiwen Xu
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Paper Abstract

In this paper, it is described that a new method to laser-CCD scanning system is applied to seamtracking. Theoretically, the deviation of the seam position can be determinied by comparing their real-time position with their references. The experiments show that the method take the precision of 0. lmm horizontally, and 0. 5mm vertically.

Paper Details

Date Published: 1 July 1990
PDF: 2 pages
Proc. SPIE 1230, International Conference on Optoelectronic Science and Engineering '90, 123038 (1 July 1990); doi: 10.1117/12.2294753
Show Author Affiliations
Shiwen Xu, Harbin Institute of Technology (China)


Published in SPIE Proceedings Vol. 1230:
International Conference on Optoelectronic Science and Engineering '90
DaHeng Wang, Editor(s)

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