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Proceedings Paper

Infrared CCD application in the equipment of circuit systems fault diagnosis
Author(s): Li Yi
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Paper Abstract

With the development of the electronic technology and with the improvement of the theory of circuit system fault diagnosis, many kinds of fault diagosis equipment have been designed. But the former equipment have a mortally drawback. The interchangeable property of its enterface between the test system and tested system is bad. If we use a uncontact interface, the drawback can be overcome. As we know, the devices in circuit have thermalradition when power on. So the whole circuit system can form a thermal image. The normal thermal image of circuit system is different from the unormal thermal image. By this principle, we can use a infrared CCD to get the thermal image and make a processing system(digital image processing system) to process this image. Then by computer, we'll compare the image of the normal system with the image of tested system, check the different, find the faults.

Paper Details

Date Published: 1 July 1990
PDF: 1 pages
Proc. SPIE 1230, International Conference on Optoelectronic Science and Engineering '90, 12302L (1 July 1990); doi: 10.1117/12.2294730
Show Author Affiliations
Li Yi, PLA Academy of Ordinance Engineering (China)

Published in SPIE Proceedings Vol. 1230:
International Conference on Optoelectronic Science and Engineering '90
DaHeng Wang, Editor(s)

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