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Proceedings Paper

UV photo-method for measurement of MCP characteristic parameters
Author(s): Jingquan Tian
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Paper Abstract

In this paper, the measurement unit and the operating principle are introduced. The key problems are represented. The experimental results are given and peculiar advantages of this method are pointed out.

Paper Details

Date Published: 1 July 1990
PDF: 3 pages
Proc. SPIE 1230, International Conference on Optoelectronic Science and Engineering '90, 12302A (1 July 1990); doi: 10.1117/12.2294719
Show Author Affiliations
Jingquan Tian, Changchun College of Optics and Fine Mechanics (China)


Published in SPIE Proceedings Vol. 1230:
International Conference on Optoelectronic Science and Engineering '90
DaHeng Wang, Editor(s)

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