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Proceedings Paper

Computerized measurement of synthetic characteristics of microchannel plates
Author(s): Yinghui Li
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Paper Abstract

A computerized measurement has been developed to assess the characteristics of microchannel plate (MCP). This paper discusses the microcomputer hardware and software techniques used in the system in circuit control, signal acquization and software package, etc.. Some measuring results have been presented.

Paper Details

Date Published: 1 July 1990
PDF: 2 pages
Proc. SPIE 1230, International Conference on Optoelectronic Science and Engineering '90, 123024 (1 July 1990); doi: 10.1117/12.2294713
Show Author Affiliations
Yinghui Li, East China Institute of Technology (China)


Published in SPIE Proceedings Vol. 1230:
International Conference on Optoelectronic Science and Engineering '90
DaHeng Wang, Editor(s)

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