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Proceedings Paper

Optimization techniques for combination-matching of systematic accuracy of opto-electronic instrument
Author(s): Erqi Wang
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Paper Abstract

Allocation of accuracy index is an engineering problem of general significance in the layout design of the opto-electronic instrument. This paper, with achieving the lowest production cost as its aim, discusses the optimal combination-matching of the allocation of accuracy index. An automatic search algorithm and its application example are also provided. This paper as a whole unfolds the possibility of realizing automatic allocation of accuracy index.

Paper Details

Date Published: 1 July 1990
PDF: 3 pages
Proc. SPIE 1230, International Conference on Optoelectronic Science and Engineering '90, 12301X (1 July 1990); doi: 10.1117/12.2294706
Show Author Affiliations
Erqi Wang, Xiamen Univ. (China)


Published in SPIE Proceedings Vol. 1230:
International Conference on Optoelectronic Science and Engineering '90
DaHeng Wang, Editor(s)

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