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Proceedings Paper

A research on ultrafast scanner
Author(s): Ruilin Ma
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Paper Abstract

A research on ultrafast scanner in ps range is reported in this paper. It is based upon the self-induced deflection by passing the laser pulses through a semiconductor wedge. Its principle and computer simulation are presented. Using 'Inclined Surface Fourier Transform 'to consider deflection, diffraction and attenuation synthetically, computation results indicate that the attenuation worsens seriously the performances of this type of scanner. Effectual correction can be obtained by adding two special attenuators on both sides of the wedge.

Paper Details

Date Published: 1 July 1990
PDF: 3 pages
Proc. SPIE 1230, International Conference on Optoelectronic Science and Engineering '90, 12301G (1 July 1990); doi: 10.1117/12.2294689
Show Author Affiliations
Ruilin Ma, South China Univ. of Technology (China)


Published in SPIE Proceedings Vol. 1230:
International Conference on Optoelectronic Science and Engineering '90
DaHeng Wang, Editor(s)

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