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Proceedings Paper

Optoelectronics for automatic inspection
Author(s): G. Longobardi
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Paper Abstract

High performance optoelectronic devices are rapidly developing, because of their vital industrial importance and related practical advantages. In this framework, both the optronic systems and the metrological and control methodologies are presented, by making references to some branches of industry. Some particular encountered cases are discussed.

Paper Details

Date Published: 1 July 1990
PDF: 6 pages
Proc. SPIE 1230, International Conference on Optoelectronic Science and Engineering '90, 12301C (1 July 1990); doi: 10.1117/12.2294685
Show Author Affiliations
G. Longobardi, Istituto Nazionale di Ottica (Italy)


Published in SPIE Proceedings Vol. 1230:
International Conference on Optoelectronic Science and Engineering '90
DaHeng Wang, Editor(s)

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