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Proceedings Paper

Compact disc inspection through measurement of low birefringence
Author(s): Arkady S. Voloshin
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Paper Abstract

Recent increase in use of compact discs attracted more attention to the problem of the quality control. Since those discs are made form polycarbonate they may exhibit birefringence introduced during manufacturing process. Such birefringence changes the index of refraction of the polycarbonate, which in turn causes deviation of the reading laser ray from rectilinear path. Currently available devices utilize laser based systems for reading of residual birefringence during disc rotation. As a result, this process is time consuming and provides averaged through the circular track information.

Paper Details

Date Published: 1 July 1990
PDF: 3 pages
Proc. SPIE 1230, International Conference on Optoelectronic Science and Engineering '90, 123016 (1 July 1990); doi: 10.1117/12.2294679
Show Author Affiliations
Arkady S. Voloshin, Lehigh Univ. (United States)


Published in SPIE Proceedings Vol. 1230:
International Conference on Optoelectronic Science and Engineering '90
DaHeng Wang, Editor(s)

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