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Proceedings Paper

The hard x-ray quantum detection efficiency of CsI-coated MCP
Author(s): Shi-Ming Xiang
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Paper Abstract

An analysis model is presented for dealing with the hard X-ray quantum detection efficiency (XQDE) of a CsI-Coated MCP. It has been proved that the model is in good agreement with the experimental results of XQDE's relation to CsI layer thickness for a series of input X-ray photon energy. Its practical significance and applications have been discussed for our designing hard X- ray wafer image intensifiers using CsI-coated as a refiction mode photocathode.

Paper Details

Date Published: 1 July 1990
PDF: 3 pages
Proc. SPIE 1230, International Conference on Optoelectronic Science and Engineering '90, 12300G (1 July 1990); doi: 10.1117/12.2294653
Show Author Affiliations
Shi-Ming Xiang, Xi'an Institute of Applied Optics (China)

Published in SPIE Proceedings Vol. 1230:
International Conference on Optoelectronic Science and Engineering '90
DaHeng Wang, Editor(s)

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