Share Email Print
cover

Proceedings Paper

The hard x-ray quantum detection efficiency of CsI-coated MCP
Author(s): Shi-Ming Xiang
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

An analysis model is presented for dealing with the hard X-ray quantum detection efficiency (XQDE) of a CsI-Coated MCP. It has been proved that the model is in good agreement with the experimental results of XQDE's relation to CsI layer thickness for a series of input X-ray photon energy. Its practical significance and applications have been discussed for our designing hard X- ray wafer image intensifiers using CsI-coated as a refiction mode photocathode.

Paper Details

Date Published: 1 July 1990
PDF: 3 pages
Proc. SPIE 1230, International Conference on Optoelectronic Science and Engineering '90, 12300G (1 July 1990); doi: 10.1117/12.2294653
Show Author Affiliations
Shi-Ming Xiang, Xi'an Institute of Applied Optics (China)


Published in SPIE Proceedings Vol. 1230:
International Conference on Optoelectronic Science and Engineering '90
DaHeng Wang, Editor(s)

© SPIE. Terms of Use
Back to Top